Graduate Category:

First Place:    Shupeng Sun, Carnegie Mellon University
Paper Title:    Fast Statistical Analysis of Rare Circuit Failure Events in High-Dimensional Variation Space
 
Second Place:    Ping Chi, University of California, Santa Barbara
Paper Title:    Facilitating PCRAM and STT-RAM as Next-Generation Memories: Architecture- and Application-Level Perspectives
 
Third Place:    Wujie Wen, University of Pittsburgh
Paper Title:    Error Characterization and Correction Techniques for Reliable STT-RAM Designs